Publication:
Unveiling the ferroelectric behavior of HfO2 thin films using fast DualEELS analysis
Date
| dc.contributor.author | Longo, Paolo | |
| dc.contributor.author | Favia, Paola | |
| dc.contributor.author | Popovici, Mihaela Ioana | |
| dc.contributor.author | Vermeulen, Bart | |
| dc.contributor.author | Spillane, Liam | |
| dc.contributor.author | Twesten, Ray | |
| dc.contributor.imecauthor | Favia, Paola | |
| dc.contributor.imecauthor | Popovici, Mihaela Ioana | |
| dc.contributor.imecauthor | Vermeulen, Bart | |
| dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
| dc.date.accessioned | 2021-10-27T12:56:04Z | |
| dc.date.available | 2021-10-27T12:56:04Z | |
| dc.date.issued | 2019 | |
| dc.identifier.issn | 1431-9276 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33472 | |
| dc.identifier.url | https://doi.org/10.1017/S1431927619003672 | |
| dc.source.beginpage | 588 | |
| dc.source.endpage | 589 | |
| dc.source.issue | S2 | |
| dc.source.journal | Microscopy and Microanalysis | |
| dc.source.volume | 25 | |
| dc.title | Unveiling the ferroelectric behavior of HfO2 thin films using fast DualEELS analysis | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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