Publication:
Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiation
Date
| dc.contributor.author | Bordallo, Caio | |
| dc.contributor.author | Teixeira, Fernando | |
| dc.contributor.author | Silveira, Marcilei | |
| dc.contributor.author | Agopian, Paula G.D. | |
| dc.contributor.author | Martino, Joao A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-22T00:48:14Z | |
| dc.date.available | 2021-10-22T00:48:14Z | |
| dc.date.issued | 2014 | |
| dc.identifier.issn | 0268-1242 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23569 | |
| dc.source.beginpage | 125015 | |
| dc.source.issue | 12 | |
| dc.source.journal | Semiconductor Science and Technology | |
| dc.source.volume | 29 | |
| dc.title | Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiation | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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