Characterization of absorption losses in rear side N-type polycrystalline silicon passivating contacts

dc.contributor.author	Firat, Meric
dc.contributor.author	Recaman Payo, Maria
dc.contributor.author	Duerinckx, Filip
dc.contributor.author	Luchies, Jan-Marc
dc.contributor.author	Lenes, Martijn
dc.contributor.author	Poortmans, Jef
dc.contributor.imecauthor	Firat, Meric
dc.contributor.imecauthor	Recaman Payo, Maria
dc.contributor.imecauthor	Duerinckx, Filip
dc.contributor.imecauthor	Poortmans, Jef
dc.contributor.orcidimec	Firat, Meric::0000-0002-6509-9668
dc.contributor.orcidimec	Duerinckx, Filip::0000-0003-2570-7371
dc.contributor.orcidimec	Poortmans, Jef::0000-0003-2077-2545
dc.date.accessioned	2021-10-27T09:14:21Z
dc.date.available	2021-10-27T09:14:21Z
dc.date.embargo	9999-12-31
dc.date.issued	2019
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/32966
dc.identifier.url	https://aip.scitation.org/doi/abs/10.1063/1.5123831
dc.source.beginpage	40004
dc.source.conference	SiliconPV 2019, the 9th International Conference on Crystalline Silicon Photovoltaics
dc.source.conferencedate	8/04/2019
dc.source.conferencelocation	Leuven Belgium
dc.title	Characterization of absorption losses in rear side N-type polycrystalline silicon passivating contacts
dc.type	Proceedings paper
dspace.entity.type	Publication
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