Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Reliability degradation of HfSiO gate dielectric layers: influence of nitridation
Publication:
Reliability degradation of HfSiO gate dielectric layers: influence of nitridation
Date
2007
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vellianitis, G.
;
Petry, Jasmine
;
Hooker, Jacob
;
Delabie, Annelies
;
De Gendt, Stefan
Journal
Microelectronic Engineering
Abstract
Description
Metrics
Views
1889
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1889
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations