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Structural characterization of ion-beam synthesized NiSi2 layers

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dc.contributor.authorWu, Ming Fang
dc.contributor.authorDe Wachter, Jo
dc.contributor.authorVan Bavel, Mieke
dc.contributor.authorMoons, Raf
dc.contributor.authorVantomme, Andre
dc.contributor.authorPattyn, Hugo
dc.contributor.authorLangouche, G.
dc.contributor.authorBender, Hugo
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorTemst, K.
dc.contributor.authorBruynseraede, Y.
dc.contributor.imecauthorVan Bavel, Mieke
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorPattyn, Hugo
dc.contributor.imecauthorBender, Hugo
dc.date.accessioned2021-09-29T13:27:06Z
dc.date.available2021-09-29T13:27:06Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1031
dc.source.beginpage1707
dc.source.endpage12
dc.source.issue3
dc.source.journalJ. Appl. Phys.
dc.source.volume78
dc.title

Structural characterization of ion-beam synthesized NiSi2 layers

dc.typeJournal article
dspace.entity.typePublication
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