Publication:
Broadband Characterization of Polymers under Reliability Stresses and Impact of Capping Layer
| dc.contributor.author | Pantano, Nicolas | |
| dc.contributor.author | Chery, Emmanuel | |
| dc.contributor.author | Op de Beeck, Maaike | |
| dc.contributor.author | Slabbekoorn, John | |
| dc.contributor.author | Beyne, Eric | |
| dc.contributor.imecauthor | Pantano, Nicolas | |
| dc.contributor.imecauthor | Chery, Emmanuel | |
| dc.contributor.imecauthor | Op de Beeck, Maaike | |
| dc.contributor.imecauthor | Slabbekoorn, John | |
| dc.contributor.imecauthor | Beyne, Eric | |
| dc.contributor.orcidimec | Chery, Emmanuel::0000-0002-2526-3873 | |
| dc.contributor.orcidimec | Op de Beeck, Maaike::0000-0002-2700-6432 | |
| dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
| dc.date.accessioned | 2023-01-05T12:36:28Z | |
| dc.date.available | 2022-09-17T02:52:06Z | |
| dc.date.available | 2023-01-05T12:36:28Z | |
| dc.date.issued | 2022 | |
| dc.identifier.doi | 10.1109/ECTC51906.2022.00195 | |
| dc.identifier.eisbn | 978-1-6654-7943-1 | |
| dc.identifier.issn | 0569-5503 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40439 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 1218 | |
| dc.source.conference | 72nd IEEE Electronic Components and Technology Conference (ECTC) | |
| dc.source.conferencedate | MAY 31-JUN 01, 2022 | |
| dc.source.conferencelocation | San Diego | |
| dc.source.endpage | 1223 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 6 | |
| dc.title | Broadband Characterization of Polymers under Reliability Stresses and Impact of Capping Layer | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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