Publication:

Reduction of electrical crosstalk in hybrid backside illuminated CMOS imagers using deep trench isolation

Date

2008
Proceedings Paper
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dc.contributor.authorMinoglou, Kiki
dc.contributor.authorDe Munck, Koen
dc.contributor.authorSabuncuoglu Tezcan, Deniz
dc.contributor.authorBorgers, Tom
dc.contributor.authorRuythooren, Wouter
dc.contributor.authorBogaerts, Jan
dc.contributor.authorFicai Veltroni, Iacopo
dc.contributor.authorZayer, Igor
dc.contributor.authorMeynart, Roland
dc.contributor.authorBezy, Jean-Loup
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorDe Moor, Piet
dc.contributor.imecauthorDe Munck, Koen
dc.contributor.imecauthorSabuncuoglu Tezcan, Deniz
dc.contributor.imecauthorBorgers, Tom
dc.contributor.imecauthorRuythooren, Wouter
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.orcidimecSabuncuoglu Tezcan, Deniz::0000-0002-9237-7862
dc.contributor.orcidimecBorgers, Tom::0000-0002-7878-6977
dc.date.accessioned2021-10-17T09:03:58Z
dc.date.available2021-10-17T09:03:58Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14171
dc.source.beginpage129
dc.source.conference1tth International Interconnect Technology Conference - IITC
dc.source.conferencedate2/06/2008
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage131
dc.title

Reduction of electrical crosstalk in hybrid backside illuminated CMOS imagers using deep trench isolation

dc.typeProceedings paper
dspace.entity.typePublication
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