Publication:
Study of the effect of multiple conductions on threshold voltage in a MIS-HEMT from 450 K down to 200 K
| dc.contributor.author | Perina, Welder F. | |
| dc.contributor.author | Martino, Joao A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Peralagu, Uthayasankaran | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.author | Agopian, Paula G. D. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.date.accessioned | 2024-03-11T11:21:56Z | |
| dc.date.available | 2023-12-14T17:35:40Z | |
| dc.date.available | 2024-03-11T11:21:56Z | |
| dc.date.issued | 2023 | |
| dc.description.wosFundingText | The author would like to thank CAPES, CNPq and FAPESP (2020/04867-2) for the financial support and imec for providing the samples used in this work.. | |
| dc.identifier.doi | 10.1109/SBMicro60499.2023.10302604 | |
| dc.identifier.eisbn | 979-8-3503-1945-3 | |
| dc.identifier.issn | 2832-420X | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43249 | |
| dc.publisher | IEEE | |
| dc.source.conference | 37th Symposium on Microelectronics Technology and Devices (SBMicro) | |
| dc.source.conferencedate | AUG 28-SEP 01, 2023 | |
| dc.source.conferencelocation | Rio de Janeiro | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 3 | |
| dc.title | Study of the effect of multiple conductions on threshold voltage in a MIS-HEMT from 450 K down to 200 K | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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