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Study of the effect of multiple conductions on threshold voltage in a MIS-HEMT from 450 K down to 200 K

 
dc.contributor.authorPerina, Welder F.
dc.contributor.authorMartino, Joao A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorCollaert, Nadine
dc.contributor.authorAgopian, Paula G. D.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2024-03-11T11:21:56Z
dc.date.available2023-12-14T17:35:40Z
dc.date.available2024-03-11T11:21:56Z
dc.date.issued2023
dc.description.wosFundingTextThe author would like to thank CAPES, CNPq and FAPESP (2020/04867-2) for the financial support and imec for providing the samples used in this work..
dc.identifier.doi10.1109/SBMicro60499.2023.10302604
dc.identifier.eisbn979-8-3503-1945-3
dc.identifier.issn2832-420X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43249
dc.publisherIEEE
dc.source.conference37th Symposium on Microelectronics Technology and Devices (SBMicro)
dc.source.conferencedateAUG 28-SEP 01, 2023
dc.source.conferencelocationRio de Janeiro
dc.source.journalN/A
dc.source.numberofpages3
dc.title

Study of the effect of multiple conductions on threshold voltage in a MIS-HEMT from 450 K down to 200 K

dc.typeProceedings paper
dspace.entity.typePublication
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