Publication:
Correlation between stress-induced leakage current (SILC) and the HfO2 bulk trap density in a SiO2/HfO2 stack
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2020 since deposited on 2021-10-15
3last month
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Acq. date: 2026-02-26
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Statistics
Views
2020 since deposited on 2021-10-15
3last month
1last week
Acq. date: 2026-02-26
Citations