Publication:

In-situ scanning electron microscopy study of fracture events during BEOL microbeam bending tests

Date

 
dc.contributor.authorVanstreels, Kris
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorZahedmanesh, Houman
dc.contributor.authorBender, Hugo
dc.contributor.authorGonzalez, Mario
dc.contributor.authorLefebvre, J.
dc.contributor.authorBhowmick, S.
dc.contributor.imecauthorVanstreels, Kris
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorZahedmanesh, Houman
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorGonzalez, Mario
dc.contributor.orcidimecVanstreels, Kris::0000-0002-4420-0966
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.accessioned2021-10-22T07:39:04Z
dc.date.available2021-10-22T07:39:04Z
dc.date.issued2014
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24747
dc.identifier.urlhttp://dx.doi.org/10.1063/1.4902516
dc.source.beginpage213102
dc.source.issue21
dc.source.journalApplied Physics Letters
dc.source.volume105
dc.title

In-situ scanning electron microscopy study of fracture events during BEOL microbeam bending tests

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections: