Publication:
Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors
| dc.contributor.author | Musibau, Solomon | |
| dc.contributor.author | Poumpouridis, N. | |
| dc.contributor.author | Tsiara, Artemisia | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Berciano, Mathias | |
| dc.contributor.author | Van Campenhout, Joris | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.author | Croes, Kristof | |
| dc.contributor.imecauthor | Musibau, S. | |
| dc.contributor.imecauthor | Tsiara, A. | |
| dc.contributor.imecauthor | Franco, J. | |
| dc.contributor.imecauthor | Berciano, M. | |
| dc.contributor.imecauthor | Van Campenhout, J. | |
| dc.contributor.imecauthor | De Wolf, I. | |
| dc.contributor.imecauthor | Croes, K. | |
| dc.date.accessioned | 2024-08-16T18:28:05Z | |
| dc.date.available | 2024-08-16T18:28:05Z | |
| dc.date.issued | 2024 | |
| dc.identifier.doi | 10.1109/IRPS48228.2024.10529439 | |
| dc.identifier.eisbn | 979-8-3503-6976-2 | |
| dc.identifier.isbn | 979-8-3503-6977-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44316 | |
| dc.publisher | IEEE | |
| dc.source.conference | International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | 2024-04-14 | |
| dc.source.conferencelocation | Grapevine | |
| dc.source.numberofpages | 10 | |
| dc.title | Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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