Publication:

Analytic modeling of the bias temperature instability using capture/emission time maps

Date

2011-12
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-1484-4007
cris.virtualsource.department812f2909-a81b-4593-9b32-75331cffa35c
cris.virtualsource.orcid812f2909-a81b-4593-9b32-75331cffa35c
dc.contributor.authorGrasser, Tibor
dc.contributor.authorWagner, Paul-Jurgen
dc.contributor.authorReisinger, Hans
dc.contributor.authorAichinger, T.
dc.contributor.authorPobegen, G.
dc.contributor.authorNelhiebel, M.
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-19T13:57:11Z
dc.date.available2021-10-19T13:57:11Z
dc.date.embargo9999-12-31
dc.date.issued2011-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19001
dc.source.beginpage618
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate4/12/2011
dc.source.conferencelocationWashington, DC USA
dc.source.endpage621
dc.title

Analytic modeling of the bias temperature instability using capture/emission time maps

dc.typeProceedings paper
dspace.entity.typePublication
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