Publication:

Silicon-on-insulator microspectrometer

Date

2008-11
Proceedings Paper
Simple item page Full metadata Statistics
 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-1266-1319
cris.virtual.orcid0000-0003-1112-8950
cris.virtual.orcid0000-0002-4667-5092
cris.virtual.orcid0000-0003-0111-431X
cris.virtualsource.department320b6e8f-da53-4221-a48d-cd95ae93e218
cris.virtualsource.departmentabd4c200-97e4-4c07-9ea0-e8e329dccb4d
cris.virtualsource.departmentb32be2a6-49e5-4859-8aac-84fd4f5bec8e
cris.virtualsource.departmentba97b4e2-c6d5-45c4-b9b4-75cedecd7d74
cris.virtualsource.orcid320b6e8f-da53-4221-a48d-cd95ae93e218
cris.virtualsource.orcidabd4c200-97e4-4c07-9ea0-e8e329dccb4d
cris.virtualsource.orcidb32be2a6-49e5-4859-8aac-84fd4f5bec8e
cris.virtualsource.orcidba97b4e2-c6d5-45c4-b9b4-75cedecd7d74
dc.contributor.authorBrouckaert, Joost
dc.contributor.authorSelvaraja, Shankar
dc.contributor.authorBogaerts, Wim
dc.contributor.authorRoelkens, Gunther
dc.contributor.authorLing, M.Y.
dc.contributor.authorAllaert, Jeroen
dc.contributor.authorDumon, Pieter
dc.contributor.authorVan Thourhout, Dries
dc.contributor.authorBaets, Roel
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.imecauthorVan Thourhout, Dries
dc.contributor.imecauthorBaets, Roel
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecVan Thourhout, Dries::0000-0003-0111-431X
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.date.accessioned2021-10-17T06:24:26Z
dc.date.available2021-10-17T06:24:26Z
dc.date.embargo9999-12-31
dc.date.issued2008-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13458
dc.source.beginpage7
dc.source.conferenceAnnual Symposium of the IEEE/LEOS Benelux Chapter
dc.source.conferencedate27/11/2008
dc.source.conferencelocationTwente The Netherlands
dc.source.endpage10
dc.title

Silicon-on-insulator microspectrometer

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
17603.pdf
Size:
459.76 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions