Publication:
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility Transistors
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1989 since deposited on 2021-10-15
Acq. date: 2026-04-05
Citations
Statistics
Views
1989 since deposited on 2021-10-15
Acq. date: 2026-04-05
Citations