Publication:

A rigorous study of measurement techniques for negative bias temperature instability

Date

2007-10
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-1484-4007
cris.virtualsource.department812f2909-a81b-4593-9b32-75331cffa35c
cris.virtualsource.orcid812f2909-a81b-4593-9b32-75331cffa35c
dc.contributor.authorGrasser, Tibor
dc.contributor.authorWagner, Paul-Jurgen
dc.contributor.authorHehenberger, Philipp
dc.contributor.authorGos, Wolfgang
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-16T16:23:21Z
dc.date.available2021-10-16T16:23:21Z
dc.date.embargo9999-12-31
dc.date.issued2007-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12226
dc.source.beginpage6
dc.source.conferenceIEEE International Integrated Reliability Workshop Final Report - IIRW
dc.source.conferencedate15/10/2007
dc.source.conferencelocationFallen Leaf Lake, CA USA
dc.source.endpage11
dc.title

A rigorous study of measurement techniques for negative bias temperature instability

dc.typeProceedings paper
dspace.entity.typePublication
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