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High-k dielectric characterization by VUV spectroscopic ellipsometry and X-ray reflection

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1914 since deposited on 2021-10-15
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Acq. date: 2025-10-25

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1914 since deposited on 2021-10-15
431item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations