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High-k dielectric characterization by VUV spectroscopic ellipsometry and X-ray reflection
Publication:
High-k dielectric characterization by VUV spectroscopic ellipsometry and X-ray reflection
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Boher, P.
;
Evrard, P.
;
Defranoux, C.
;
Fouere, J.C.
;
Bellandi, E.
;
Bender, Hugo
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1914
since deposited on 2021-10-15
431
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1914
since deposited on 2021-10-15
431
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations