Publication:

Differential phase contrast (DPC) mapping electric fields: Optimising experimental conditions

Date

2024
Journal article
https://doi.org/10.1111/jmi.13271
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dc.contributor.authorLi, Chen
dc.contributor.authorMu, Xiaoke
dc.contributor.authorKorytov, Maxim
dc.contributor.authorAlexandrou, Ioannis
dc.contributor.authorBosch, Eric G. T.
dc.contributor.imecauthorKorytov, Maxim
dc.contributor.orcidimecKorytov, Maxim::0009-0001-9313-7019
dc.date.accessioned2024-09-24T09:27:20Z
dc.date.available2024-02-24T18:11:28Z
dc.date.available2024-09-24T09:27:20Z
dc.date.issued2024
dc.identifier.doi10.1111/jmi.13271
dc.identifier.issn0022-2720
dc.identifier.pmidMEDLINE:38353282
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43584
dc.publisherWILEY
dc.source.beginpage177
dc.source.endpage188
dc.source.issue3
dc.source.journalJOURNAL OF MICROSCOPY
dc.source.numberofpages12
dc.source.volume293
dc.subject.keywordsSTEM
dc.title

Differential phase contrast (DPC) mapping electric fields: Optimising experimental conditions

dc.typeJournal article
dspace.entity.typePublication
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