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Strength and Reliability Characterization of Multi-Level Back-End-of-Line under Chip Package Interaction Loading
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Strength and Reliability Characterization of Multi-Level Back-End-of-Line under Chip Package Interaction Loading
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Date
2017-12
Dissertation
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43169.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kljucar, Luka
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1992
since deposited on 2021-10-24
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Acq. date: 2025-12-17
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Metrics
Views
1992
since deposited on 2021-10-24
3
last month
Acq. date: 2025-12-17
Citations