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Random telegraph noise: the key to single defect studies in nano-devices
Publication:
Random telegraph noise: the key to single defect studies in nano-devices
Date
2016
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Fang, Wen
;
Aoulaiche, Marc
;
Luo, Jun
;
Zhao, Chao
;
Claeys, Cor
Journal
Thin Solid Films
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1928
since deposited on 2021-10-23
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Acq. date: 2025-10-25
Citations
Metrics
Views
1928
since deposited on 2021-10-23
426
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations