Publication:

Random telegraph noise: the key to single defect studies in nano-devices

Date

2016

Journal article

Simple item page Full metadata Statistics

Author(s)

;

;

Aoulaiche, Marc

;

;

;

Journal

Thin Solid Films

Statistics

1933 since deposited on 2021-10-23

1last month

Acq. date: 2026-02-25