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EUV dose reduction for pitch 28 nm line-space
Publication:
EUV dose reduction for pitch 28 nm line-space
Date
2024
Proceedings Paper
https://doi.org/10.1117/12.3034646
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gupta, Mihir
;
Verstraete, Lander
;
Franke, Joern-Holger
;
Kundu, Achintya
;
Fallica, Roberto
;
Ronse, Kurt
;
Gallagher, Emily
;
De Simone, Danilo
;
Philipsen, Vicky
;
Suh, Hyo Seon
Journal
Proceedings of SPIE
Abstract
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112
since deposited on 2025-05-11
Acq. date: 2025-10-24
Citations
Metrics
Views
112
since deposited on 2025-05-11
Acq. date: 2025-10-24
Citations