Publication:

Impact of the substrate and buffer design on the performance of GaN on Si

Date

2018

Journal article

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Author(s)

;

Meneghini, Matteo

;

Stoffels, Steve

;

Van Hove, Marleen

;

;

;

Decoutere, Stefaan

;

;

Gaudenzio, Meneghesso

Journal

Microelectronics Reliability

Metrics

1971 since deposited on 2021-10-25

Acq. date: 2026-01-06