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Rare earth materials for semiconductor applications

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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0001-9739-7419
cris.virtual.orcid0000-0002-9838-1088
cris.virtual.orcid0000-0001-7547-7194
cris.virtual.orcid0000-0003-2597-8534
cris.virtual.orcid0000-0002-4831-3159
cris.virtual.orcid0000-0001-8220-870X
cris.virtual.orcid0009-0003-5338-4167
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-5012-0356
cris.virtual.orcid0000-0002-6512-1909
cris.virtual.orcid0000-0003-1533-7055
cris.virtual.orcid0000-0002-5516-7962
cris.virtualsource.department36689418-e07f-4cc4-8c33-f09792001dfb
cris.virtualsource.department9ffffcab-46a1-405e-85f2-7f9ac2e7ec59
cris.virtualsource.department5afcb429-ac38-4c13-8422-3088287ba9bd
cris.virtualsource.departmente4ac68d7-5930-48b8-86aa-3899f9455539
cris.virtualsource.department3e839b18-b9e5-46f9-95d4-760837031f7a
cris.virtualsource.department97013840-4a92-4f62-9440-b4729dd38e27
cris.virtualsource.department6686eb58-7d9f-4f12-963f-896ec7329368
cris.virtualsource.departmentb0d25bb3-47fb-4796-aac0-8dbbcc0c5614
cris.virtualsource.department12776425-eae4-41f0-a07f-67df0fd7d275
cris.virtualsource.department32cb1b39-012f-4058-8938-a74f310b957c
cris.virtualsource.departmentb6fe8435-25ec-4001-83c8-3a746a28d88c
cris.virtualsource.department2fc65eb2-c2f1-4505-bb09-96f2d0aa6ce9
cris.virtualsource.department29b49413-16f6-402a-847f-7305c9088192
cris.virtualsource.orcid36689418-e07f-4cc4-8c33-f09792001dfb
cris.virtualsource.orcid9ffffcab-46a1-405e-85f2-7f9ac2e7ec59
cris.virtualsource.orcid5afcb429-ac38-4c13-8422-3088287ba9bd
cris.virtualsource.orcide4ac68d7-5930-48b8-86aa-3899f9455539
cris.virtualsource.orcid3e839b18-b9e5-46f9-95d4-760837031f7a
cris.virtualsource.orcid97013840-4a92-4f62-9440-b4729dd38e27
cris.virtualsource.orcid6686eb58-7d9f-4f12-963f-896ec7329368
cris.virtualsource.orcidb0d25bb3-47fb-4796-aac0-8dbbcc0c5614
cris.virtualsource.orcid12776425-eae4-41f0-a07f-67df0fd7d275
cris.virtualsource.orcid32cb1b39-012f-4058-8938-a74f310b957c
cris.virtualsource.orcidb6fe8435-25ec-4001-83c8-3a746a28d88c
cris.virtualsource.orcid2fc65eb2-c2f1-4505-bb09-96f2d0aa6ce9
cris.virtualsource.orcid29b49413-16f6-402a-847f-7305c9088192
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorSwerts, Johan
dc.contributor.authorDelabie, Annelies
dc.contributor.authorNyns, Laura
dc.contributor.authorShi, Xiaoping
dc.contributor.authorTielens, Hilde
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorSchram, Tom
dc.contributor.authorPierreux, Dieter
dc.contributor.authorMaes, Jan
dc.contributor.authorHardy, An
dc.contributor.authorVan Bael, Marlies
dc.contributor.authorKittl, Jorge
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorNyns, Laura
dc.contributor.imecauthorTielens, Hilde
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorPierreux, Dieter
dc.contributor.imecauthorMaes, Jan
dc.contributor.imecauthorHardy, An
dc.contributor.imecauthorVan Bael, Marlies
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecNyns, Laura::0000-0001-8220-870X
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecVan Bael, Marlies::0000-0002-5516-7962
dc.date.accessioned2021-10-18T23:02:22Z
dc.date.available2021-10-18T23:02:22Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18176
dc.source.beginpage931
dc.source.conference217th ECS Meeting
dc.source.conferencedate25/04/2010
dc.source.conferencelocationVancouver Canada
dc.title

Rare earth materials for semiconductor applications

dc.typeMeeting abstract
dspace.entity.typePublication
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