Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited

Publication:

1995

Presentation

Author(s)

Janssens, Koenraad

;

Van Der Biest, O.

;

Vanhellemont, Jan

;

Maes, Herman

;

Hull, R.

2107 since deposited on 2021-09-29

Acq. date: 2026-01-06