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Mixed-signal and noise properties of nMOSFETs with HfSiON/TaN gate stacks
Publication:
Mixed-signal and noise properties of nMOSFETs with HfSiON/TaN gate stacks
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rittersma, Chris
;
Simoen, Eddy
;
Srinivasan, Purushothaman
;
Vertregt, M.
;
Claeys, Cor
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1903
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Acq. date: 2026-01-26
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Statistics
Views
1903
since deposited on 2021-10-16
1
last month
Acq. date: 2026-01-26
Citations