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Statistical model for prebreakdown current jumps and breakdown caused by single traps in magnetic tunnel junctions

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dc.contributor.authorDas, Johan
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorStein, S.
dc.contributor.authorKohlstedt, H.
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorDe Boeck, Jo
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorDe Boeck, Jo
dc.date.accessioned2021-10-15T04:15:39Z
dc.date.available2021-10-15T04:15:39Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7382
dc.source.beginpage2749
dc.source.endpage2751
dc.source.issue4
dc.source.journalJ. Applied Physics
dc.source.volume94
dc.title

Statistical model for prebreakdown current jumps and breakdown caused by single traps in magnetic tunnel junctions

dc.typeJournal article
dspace.entity.typePublication
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