Publication:
Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs with a Schottky p-GaN Gate
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506 since deposited on 2024-08-16
4last month
Acq. date: 2026-01-11
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Views
506 since deposited on 2024-08-16
4last month
Acq. date: 2026-01-11
Citations