Publication:

Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs with a Schottky p-GaN Gate

Date

2024

Proceedings Paper

https://doi.org/10.1109/IRPS48228.2024.10529393

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Author(s)

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Bakeroot, Benoit

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Posthuma, Niels

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Decoutere, Stefaan

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Tallarico, A. N.

Journal

N/A

Statistics

506 since deposited on 2024-08-16

Acq. date: 2026-02-26