Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Characterization of ALD diffusion barrier on low-k dielectric polymer by contact angle measurements
Publication:
Characterization of ALD diffusion barrier on low-k dielectric polymer by contact angle measurements
Date
2002
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martin Hoyas, Ana
;
Schuhmacher, Jorg
;
Celis, Jean-Pierre
;
Maex, Karen
Journal
Abstract
Description
Metrics
Views
1936
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1936
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations