Publication:
Simple analytical model to study the STC bias point in FinFETs
Date
| dc.contributor.author | Bellodi, M. | |
| dc.contributor.author | Camillo, L.M. | |
| dc.contributor.author | Martino, J.A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T15:03:35Z | |
| dc.date.available | 2021-10-16T15:03:35Z | |
| dc.date.issued | 2007 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11712 | |
| dc.source.beginpage | 205 | |
| dc.source.conference | Silicon-on-Insulator Technology and Devices 13 | |
| dc.source.conferencedate | 6/05/2007 | |
| dc.source.conferencelocation | Chicago, IL USA | |
| dc.source.endpage | 209 | |
| dc.title | Simple analytical model to study the STC bias point in FinFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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