Publication:

The defect-centric perspective of device and circuit reliability – from individual defects to circuits

Date

2015
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-3763-2098
cris.virtual.orcid0000-0002-5847-3949
cris.virtual.orcid0000-0002-3599-8515
cris.virtual.orcid0000-0001-8434-1838
cris.virtual.orcid0000-0002-0402-8225
cris.virtual.orcid0000-0002-4609-5573
cris.virtual.orcid0000-0002-1484-4007
cris.virtual.orcid0000-0002-7382-8605
cris.virtualsource.department2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.department037e6881-9aff-485e-9d58-d5383949642f
cris.virtualsource.department7a992f6f-feea-493d-b4d8-c297450cff52
cris.virtualsource.department63eea5a8-b81a-4bb2-aa67-715ba610971a
cris.virtualsource.departmentf2e648b4-91e6-42de-bb5d-66326414095e
cris.virtualsource.department8b84673b-878f-4c3b-959d-b7cdae2d70d9
cris.virtualsource.department812f2909-a81b-4593-9b32-75331cffa35c
cris.virtualsource.department54f24b6a-b745-4c59-a5bc-058756e94864
cris.virtualsource.orcid2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.orcid037e6881-9aff-485e-9d58-d5383949642f
cris.virtualsource.orcid7a992f6f-feea-493d-b4d8-c297450cff52
cris.virtualsource.orcid63eea5a8-b81a-4bb2-aa67-715ba610971a
cris.virtualsource.orcidf2e648b4-91e6-42de-bb5d-66326414095e
cris.virtualsource.orcid8b84673b-878f-4c3b-959d-b7cdae2d70d9
cris.virtualsource.orcid812f2909-a81b-4593-9b32-75331cffa35c
cris.virtualsource.orcid54f24b6a-b745-4c59-a5bc-058756e94864
dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRoussel, Philippe
dc.contributor.authorBury, Erik
dc.contributor.authorCho, Moon Ju
dc.contributor.authorDegraeve, Robin
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorKukner, Halil
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.authorRzepa, Gerhard
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-22T20:00:26Z
dc.date.available2021-10-22T20:00:26Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25447
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7324754
dc.source.beginpage218
dc.source.conference45th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate14/09/2015
dc.source.conferencelocationGraz Austria
dc.source.endpage225
dc.title

The defect-centric perspective of device and circuit reliability – from individual defects to circuits

dc.typeProceedings paper
dspace.entity.typePublication
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