Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
3D Wafer-to-Wafer Bonding Thermal Resistance Comparison: Hybrid Cu/dielectric Bonding versus Dielectric via-last Bonding
Publication:
3D Wafer-to-Wafer Bonding Thermal Resistance Comparison: Hybrid Cu/dielectric Bonding versus Dielectric via-last Bonding
Date
2020
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Oprins, Herman
;
Cherman, Vladimir
;
Webers, Tomas
;
Kim, Soon-Wook
;
de Vos, Joeri
;
Van der Plas, Geert
;
Beyne, Eric
Journal
na
Abstract
Description
Metrics
Views
1901
since deposited on 2021-11-02
Acq. date: 2025-10-27
Citations
Metrics
Views
1901
since deposited on 2021-11-02
Acq. date: 2025-10-27
Citations