Publication:
Propelling Widespread GaN Electronics Adoption With Large Diameter and CMOS Fab-Friendly GaN-on-QST® Manufacturing Platform
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
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| cris.virtual.orcid | 0000-0002-2831-0719 | |
| cris.virtual.orcid | 0000-0003-1815-3972 | |
| cris.virtual.orcid | 0000-0003-4392-1777 | |
| cris.virtual.orcid | 0000-0001-6632-6239 | |
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| cris.virtualsource.department | 5409e7a7-e466-4bec-8a37-d4f2213f44dd | |
| cris.virtualsource.department | dc976311-c8c1-48f6-9557-3dbf30966b9e | |
| cris.virtualsource.department | a1ba6cc5-b3a9-4b31-8f64-a47cbd839f9c | |
| cris.virtualsource.orcid | 8ec92196-e614-4f8c-b405-11eed8c41ef7 | |
| cris.virtualsource.orcid | 5409e7a7-e466-4bec-8a37-d4f2213f44dd | |
| cris.virtualsource.orcid | dc976311-c8c1-48f6-9557-3dbf30966b9e | |
| cris.virtualsource.orcid | a1ba6cc5-b3a9-4b31-8f64-a47cbd839f9c | |
| dc.contributor.author | Odnoblyudov, V. | |
| dc.contributor.author | Basceri, C. | |
| dc.contributor.author | Kurth, C. | |
| dc.contributor.author | Yamada, M. | |
| dc.contributor.author | Konishi, S. | |
| dc.contributor.author | Kawahara, M. | |
| dc.contributor.author | Liao, C. -C. | |
| dc.contributor.author | Shen, S. | |
| dc.contributor.author | Chiu, J. | |
| dc.contributor.author | Geens, Karen | |
| dc.contributor.author | Vohra, Anurag | |
| dc.contributor.author | Bakeroot, Benoit | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.author | Hahn, H. | |
| dc.contributor.author | Heuken, M. | |
| dc.date.accessioned | 2026-04-21T09:57:13Z | |
| dc.date.available | 2026-04-21T09:57:13Z | |
| dc.date.createdwos | 2026-03-18 | |
| dc.date.issued | 2024 | |
| dc.description.abstract | The SEMI standard thickness, CMOS fab-friendly and large diameter QST® (QROMIS Substrate Technology) substrates enable manufacturing of commercial high-performance GaN power devices with breakdown voltages ranging from 100V to 2000V and beyond. This is achieved by utilizing a polycrystalline ceramic substrate core with the coefficient of thermal expansion (CTE) matched to GaN over a wide temperature range. In this work, the status of 200mm and 300mm commercial QST® substrates and GaN-on-QST® epi-wafers will be discussed. The production status of 650V GaN-on-QST® E-mode HEMT devices on a commercial, high volume 200mm CMOS foundry manufacturing platform is presented. Also, the results of the development work in 200mm CMOS fabs on high-quality 1,200V E-mode HEMTs are included. | |
| dc.description.wosFundingText | The authors are grateful to the members of Vanguard International Semiconductor Corp., Shin-Etsu Chemical Co. Ltd., imec, and AIXTRON for their contributions and support. The work at imec received funding from the Chips Joint Undertaking supporting the ALL2GaN Project under grant Agreement No 101111890 and its members including the top-up funding by Austria, Belgium, Czech Republic, Denmark, Germany, Greece, Netherlands, Norway, Slovakia, Spain, Sweden and Switzerland. Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union or the national granting authorities. Neither the European Union nor the national granting authorities can be held responsible for them. | |
| dc.identifier.doi | 10.1109/iedm50854.2024.10873423 | |
| dc.identifier.issn | 2380-9248 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/59144 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Electron Devices Meeting (IEDM) | |
| dc.source.conferencedate | 2024-12-07 | |
| dc.source.conferencelocation | San Francisco | |
| dc.source.journal | 2024 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, IEDM | |
| dc.source.numberofpages | 4 | |
| dc.title | Propelling Widespread GaN Electronics Adoption With Large Diameter and CMOS Fab-Friendly GaN-on-QST® Manufacturing Platform | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2026-04-07 | |
| imec.internal.source | crawler | |
| imec.internal.wosCreatedAt | 2026-04-07 | |
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