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Propelling Widespread GaN Electronics Adoption With Large Diameter and CMOS Fab-Friendly GaN-on-QST® Manufacturing Platform

 
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cris.virtual.orcid0000-0002-2831-0719
cris.virtual.orcid0000-0003-1815-3972
cris.virtual.orcid0000-0003-4392-1777
cris.virtual.orcid0000-0001-6632-6239
cris.virtualsource.department8ec92196-e614-4f8c-b405-11eed8c41ef7
cris.virtualsource.department5409e7a7-e466-4bec-8a37-d4f2213f44dd
cris.virtualsource.departmentdc976311-c8c1-48f6-9557-3dbf30966b9e
cris.virtualsource.departmenta1ba6cc5-b3a9-4b31-8f64-a47cbd839f9c
cris.virtualsource.orcid8ec92196-e614-4f8c-b405-11eed8c41ef7
cris.virtualsource.orcid5409e7a7-e466-4bec-8a37-d4f2213f44dd
cris.virtualsource.orciddc976311-c8c1-48f6-9557-3dbf30966b9e
cris.virtualsource.orcida1ba6cc5-b3a9-4b31-8f64-a47cbd839f9c
dc.contributor.authorOdnoblyudov, V.
dc.contributor.authorBasceri, C.
dc.contributor.authorKurth, C.
dc.contributor.authorYamada, M.
dc.contributor.authorKonishi, S.
dc.contributor.authorKawahara, M.
dc.contributor.authorLiao, C. -C.
dc.contributor.authorShen, S.
dc.contributor.authorChiu, J.
dc.contributor.authorGeens, Karen
dc.contributor.authorVohra, Anurag
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorHahn, H.
dc.contributor.authorHeuken, M.
dc.date.accessioned2026-04-21T09:57:13Z
dc.date.available2026-04-21T09:57:13Z
dc.date.createdwos2026-03-18
dc.date.issued2024
dc.description.abstractThe SEMI standard thickness, CMOS fab-friendly and large diameter QST® (QROMIS Substrate Technology) substrates enable manufacturing of commercial high-performance GaN power devices with breakdown voltages ranging from 100V to 2000V and beyond. This is achieved by utilizing a polycrystalline ceramic substrate core with the coefficient of thermal expansion (CTE) matched to GaN over a wide temperature range. In this work, the status of 200mm and 300mm commercial QST® substrates and GaN-on-QST® epi-wafers will be discussed. The production status of 650V GaN-on-QST® E-mode HEMT devices on a commercial, high volume 200mm CMOS foundry manufacturing platform is presented. Also, the results of the development work in 200mm CMOS fabs on high-quality 1,200V E-mode HEMTs are included.
dc.description.wosFundingTextThe authors are grateful to the members of Vanguard International Semiconductor Corp., Shin-Etsu Chemical Co. Ltd., imec, and AIXTRON for their contributions and support. The work at imec received funding from the Chips Joint Undertaking supporting the ALL2GaN Project under grant Agreement No 101111890 and its members including the top-up funding by Austria, Belgium, Czech Republic, Denmark, Germany, Greece, Netherlands, Norway, Slovakia, Spain, Sweden and Switzerland. Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union or the national granting authorities. Neither the European Union nor the national granting authorities can be held responsible for them.
dc.identifier.doi10.1109/iedm50854.2024.10873423
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59144
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedate2024-12-07
dc.source.conferencelocationSan Francisco
dc.source.journal2024 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, IEDM
dc.source.numberofpages4
dc.title

Propelling Widespread GaN Electronics Adoption With Large Diameter and CMOS Fab-Friendly GaN-on-QST® Manufacturing Platform

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2026-04-07
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-04-07
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