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New aspects of nanopotentiometry for MOSFET transistors
Publication:
New aspects of nanopotentiometry for MOSFET transistors
Date
1999
Proceedings Paper
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3861.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Trenkler, Thomas
;
Stephenson, Robert
;
Jansen, Philippe
;
Vandervorst, Wilfried
;
Hellemans, L.
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2045
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Acq. date: 2025-12-08
Citations
Metrics
Views
2045
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-08
Citations