Publication:

Cycling Induced Metastable Degradation in GeSe Ovonic Threshold Switching Selector

 
dc.contributor.authorChai, Zheng
dc.contributor.authorZhang, Weidong
dc.contributor.authorClima, Sergiu
dc.contributor.authorHatem, Firas
dc.contributor.authorDegraeve, Robin
dc.contributor.authorDiao, Qihui
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorFreitas, Pedro
dc.contributor.authorMarsland, John
dc.contributor.authorFantini, Andrea
dc.contributor.authorGarbin, Daniele
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidextZhang, Weidong::0000-0003-4600-7382
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.date.accessioned2023-01-19T10:07:30Z
dc.date.available2021-11-02T15:56:41Z
dc.date.available2023-01-19T10:07:30Z
dc.date.embargo2023-01-01
dc.date.issued2021
dc.identifier.doi10.1109/LED.2021.3109582
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37534
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage1448
dc.source.endpage1451
dc.source.issue10
dc.source.journalIEEE ELECTRON DEVICE LETTERS
dc.source.numberofpages4
dc.source.volume42
dc.title

Cycling Induced Metastable Degradation in GeSe Ovonic Threshold Switching Selector

dc.typeJournal article
dspace.entity.typePublication
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