Publication:
Effect of X-Ray Irradiation on Colloidal Quantum Dot SWIR CMOS Image Sensor
| dc.contributor.author | Jin, Minhyun | |
| dc.contributor.author | Lee, Sangyeon | |
| dc.contributor.author | Santos, Pedro | |
| dc.contributor.author | Kang, Jubin | |
| dc.contributor.author | Georgitzikis, Epimitheas | |
| dc.contributor.author | Kim, Joo Hyoung | |
| dc.contributor.author | Genoe, Jan | |
| dc.contributor.author | Kim, Soo Youn | |
| dc.contributor.author | Meynants, Guy | |
| dc.contributor.author | Malinowski, Pawel | |
| dc.contributor.author | Lee, Jiwon | |
| dc.contributor.imecauthor | Jin, Minhyun | |
| dc.contributor.imecauthor | Kang, Jubin | |
| dc.contributor.imecauthor | Georgitzikis, Epimitheas | |
| dc.contributor.imecauthor | Kim, Joo Hyoung | |
| dc.contributor.imecauthor | Genoe, Jan | |
| dc.contributor.imecauthor | Lee, Jiwon | |
| dc.contributor.imecauthor | Lee, Sangyeon | |
| dc.contributor.imecauthor | Malinowski, Pawel | |
| dc.contributor.orcidimec | Georgitzikis, Epimitheas::0000-0001-5972-8328 | |
| dc.contributor.orcidimec | Kim, Joo Hyoung::0000-0002-2118-596X | |
| dc.contributor.orcidimec | Genoe, Jan::0000-0002-4019-5979 | |
| dc.contributor.orcidimec | Lee, Jiwon::0000-0003-3738-4872 | |
| dc.contributor.orcidimec | Lee, Sangyeon::0000-0002-7323-2852 | |
| dc.contributor.orcidimec | Malinowski, Pawel::0000-0002-2934-470X | |
| dc.date.accessioned | 2024-08-22T12:08:18Z | |
| dc.date.available | 2023-12-08T17:19:24Z | |
| dc.date.available | 2024-08-22T12:08:18Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | This work was supported by the Ministry of Trade, Industry, and Energy (MOTIE) in South Korea, under the Fostering Global Talents for Innovative Growth Program supervised by the Korea Institute for Advancement of Technology (KIAT) under Grant P0017312. | |
| dc.identifier.doi | 10.1109/TED.2023.3329452 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43237 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 613 | |
| dc.source.endpage | 618 | |
| dc.source.issue | 1 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 6 | |
| dc.source.volume | 71 | |
| dc.subject.keywords | INDUCED DARK CURRENT | |
| dc.subject.keywords | RADIATION | |
| dc.title | Effect of X-Ray Irradiation on Colloidal Quantum Dot SWIR CMOS Image Sensor | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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