Publication:

Performance and reliability of 0.35μm/0.25μm HIMOS® technology for embedded flash memory applications

Date

1999
Proceedings Paper
Simple item page Full metadata Statistics
 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-8245-9442
cris.virtual.orcid0000-0003-1381-6925
cris.virtualsource.departmentf421472b-3c78-4486-a88e-266fc55314cb
cris.virtualsource.department39ca1b0f-7306-4c78-a654-f9ff9f4c8183
cris.virtualsource.orcidf421472b-3c78-4486-a88e-266fc55314cb
cris.virtualsource.orcid39ca1b0f-7306-4c78-a654-f9ff9f4c8183
dc.contributor.authorWellekens, Dirk
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorVerheyen, Peter
dc.contributor.authorFrisson, Jo
dc.contributor.authorLorenzini, Martino
dc.contributor.authorXue, Gang
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecVerheyen, Peter::0000-0002-8245-9442
dc.date.accessioned2021-10-14T11:57:12Z
dc.date.available2021-10-14T11:57:12Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4023
dc.source.beginpage538
dc.source.conferenceExtended Abstracts of the 1999 International Conference on Solid State Devices and Materials - SSDM
dc.source.conferencedate21/09/1999
dc.source.conferencelocationTokyo Japan
dc.source.endpage539
dc.title

Performance and reliability of 0.35μm/0.25μm HIMOS® technology for embedded flash memory applications

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
3991.pdf
Size:
186.31 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions