Publication:

Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?

Date

2022
Journal article
https://doi.org/10.1002/adma.202201082
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dc.contributor.authorWaltl, Michael
dc.contributor.authorKnobloch, Theresia
dc.contributor.authorTselios, Konstantinos
dc.contributor.authorFilipovic, Lado
dc.contributor.authorStampfer, Bernhard
dc.contributor.authorHernandez, Yoanlys
dc.contributor.authorWaldhor, Dominic
dc.contributor.authorIllarionov, Yury
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2022-12-15T15:13:06Z
dc.date.available2022-04-24T02:09:56Z
dc.date.available2022-05-05T07:16:48Z
dc.date.available2022-12-15T15:13:06Z
dc.date.issued2022
dc.description.wosFundingTextThe financial support by the Austrian Federal Ministry for Digital and Economic Affairs, the National Foundation for Research, Technology and Development and the Christian Doppler Research Association is gratefully acknowledged. Furthermore, this work was supported in part by the Austrian Research Promotion Agency FFG (Take off Programm) under project 1566737 and project 1782079 as well as the FFG (Bridge-Young-Scientists) under project 1755510. Additionally, the financial support through FWF grants I2606-N30, I4123-N30, and I5296-N is gratefully acknowledged. Y.I. also acknowledges the support from the Ministry of Science and Higher Education of the Russian Federation under project number 075-15-2020-790.
dc.identifier.doi10.1002/adma.202201082
dc.identifier.issn0935-9648
dc.identifier.pmidMEDLINE:35318749
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39669
dc.publisherWILEY-V C H VERLAG GMBH
dc.source.beginpage2201082
dc.source.endpagena
dc.source.issue48
dc.source.journalADVANCED MATERIALS
dc.source.numberofpages23
dc.source.volume34
dc.subject.keywordsFIELD-EFFECT TRANSISTOR
dc.subject.keywordsBIAS-TEMPERATURE INSTABILITY
dc.subject.keywordsATOMIC LAYER DEPOSITION
dc.subject.keywordsRANDOM TELEGRAPH NOISE
dc.subject.keywordsHIGH-PERFORMANCE WSE2
dc.subject.keywords2-DIMENSIONAL MATERIALS
dc.subject.keywordsWAFER-SCALE
dc.subject.keywordsPROCESS VARIABILITY
dc.subject.keywordsNBTI DEGRADATION
dc.subject.keywordsMOS2 TRANSISTORS
dc.title

Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?

dc.typeJournal article
dspace.entity.typePublication
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