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Measurement of nonuniform stresses in semiconductors by the micro-Raman method
Publication:
Measurement of nonuniform stresses in semiconductors by the micro-Raman method
Date
1998
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pinardi, Kuntjoro
;
Jain, Suresh
;
Maes, Herman
;
Van Overstraeten, Roger
;
Willander, M.
;
Atkinson, A.
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1905
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations
Metrics
Views
1905
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations