Publication:
Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1950 since deposited on 2021-10-24
Acq. date: 2025-10-22
Citations
Metrics
Views
1950 since deposited on 2021-10-24
Acq. date: 2025-10-22
Citations