Publication:

Impact of the metal gate on the oxide stack quality assessed by low-frequency noise

Date

2017

Proceedings Paper

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Files

35760.pdf 988.07 KB

Author(s)

;

;

O'Sullivan, Barry

;

Veloso, Anabela

;

Horiguchi, Naoto

;

Collaert, Nadine

;

Statistics

1919 since deposited on 2021-10-24

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Acq. date: 2026-04-27