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Epitaxial Ge on standard STI patterned Si wafers: high quality virtual substrates for Ge pMOS and III/V nMOS
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Epitaxial Ge on standard STI patterned Si wafers: high quality virtual substrates for Ge pMOS and III/V nMOS
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Date
2009
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18814.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Loo, Roger
;
Wang, Gang
;
Souriau, Laurent
;
Lin, Vic
;
Brammertz, Guy
;
Caymax, Matty
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1950
since deposited on 2021-10-18
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Acq. date: 2025-12-10
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Views
1950
since deposited on 2021-10-18
2
last month
Acq. date: 2025-12-10
Citations