Publication:
Advanced Electrical Characterization Techniques for MOSFET's and MOSFET Reliability
Date
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-09-29T12:41:45Z | |
| dc.date.available | 2021-09-29T12:41:45Z | |
| dc.date.issued | 1994 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/179 | |
| dc.source.conference | International Electron Devices Meeting (IEDM); December 11-14, 1994; San Francisco, Calif., USA. | |
| dc.title | Advanced Electrical Characterization Techniques for MOSFET's and MOSFET Reliability | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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