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The modeling of electromigration: a new challenge for TCAD?
Publication:
The modeling of electromigration: a new challenge for TCAD?
Date
1998
Proceedings Paper
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2470.pdf
173.67 KB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schoenmaker, Wim
;
Petrescu, Violeta
Journal
Abstract
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1886
since deposited on 2021-10-01
Acq. date: 2025-10-25
Citations
Metrics
Views
1886
since deposited on 2021-10-01
Acq. date: 2025-10-25
Citations