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Conference contributions
Single-electron capacitance spectroscopy of individual dopants in silicon
Publication:
Single-electron capacitance spectroscopy of individual dopants in silicon
Date
2012-02
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
DeNinno, Matthew
;
Gasseller, Morewell
;
Harrison, James
;
Tessmer, Stuart
;
Rogge, Sven
;
Caymax, Matty
;
Loo, Roger
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Abstract
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1828
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1828
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations