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Fundamentals and extraction of velocity saturation in sub-100nm (110)-Si and (100)-Ge

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dc.contributor.authorPantisano, Luigi
dc.contributor.authorTrojman, Lionel
dc.contributor.authorMitard, Jerome
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorSeveri, Simone
dc.contributor.authorEneman, Geert
dc.contributor.authorCrupi, G.
dc.contributor.authorHoffmann, Thomas Y.
dc.contributor.authorFerain, Isabelle
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorSeveri, Simone
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.accessioned2021-10-17T09:34:37Z
dc.date.available2021-10-17T09:34:37Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14265
dc.source.beginpage52
dc.source.conferenceSymposium on VLSI Technology. Digest of Technical Papers
dc.source.conferencedate17/06/2008
dc.source.conferencelocationHonolulu, HI USA
dc.source.endpage53
dc.title

Fundamentals and extraction of velocity saturation in sub-100nm (110)-Si and (100)-Ge

dc.typeProceedings paper
dspace.entity.typePublication
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