Publication:
The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements
Date
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-5604-4198 | |
| cris.virtual.orcid | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-4630-5569 | |
| cris.virtual.orcid | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
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| cris.virtualsource.department | 3b4fdab4-572d-472c-a07d-551bbe745a80 | |
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| cris.virtualsource.orcid | 3b4fdab4-572d-472c-a07d-551bbe745a80 | |
| cris.virtualsource.orcid | bb9c66a8-60a0-4f4b-9c7c-d1ca7e7f5571 | |
| dc.contributor.author | Witvrouw, Ann | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.author | De Ceuninck, Ward | |
| dc.contributor.author | Lekens, Geert | |
| dc.contributor.author | D'Haen, Jan | |
| dc.contributor.author | De Schepper, Luc | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.contributor.imecauthor | De Ceuninck, Ward | |
| dc.contributor.imecauthor | Lekens, Geert | |
| dc.contributor.imecauthor | D'Haen, Jan | |
| dc.date.accessioned | 2021-10-01T09:49:04Z | |
| dc.date.available | 2021-10-01T09:49:04Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 1998 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3158 | |
| dc.source.beginpage | 1035 | |
| dc.source.conference | Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 1041 | |
| dc.title | The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |