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Sources of variability in scaled MoS2 FETs
Publication:
Sources of variability in scaled MoS2 FETs
Date
2020
Proceedings Paper
https://doi.org/10.1109/IEDM13553.2020.9371890
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Smets, Quentin
;
Verreck, Devin
;
Shi, Yuanyuan
;
Arutchelvan, Goutham
;
Groven, Benjamin
;
Wu, Xiangyu
;
Sutar, Surajit
;
Banerjee, Sreetama
;
Nalin Mehta, Ankit
;
Lin, Dennis
;
Asselberghs, Inge
;
Radu, Iuliana
Journal
na
Abstract
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1922
since deposited on 2021-12-06
Acq. date: 2025-10-23
Citations
Metrics
Views
1922
since deposited on 2021-12-06
Acq. date: 2025-10-23
Citations