Publication:

Sources of variability in scaled MoS2 FETs

Date

2020

Proceedings Paper

https://doi.org/10.1109/IEDM13553.2020.9371890

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Author(s)

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Arutchelvan, Goutham

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Groven, Benjamin

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Banerjee, Sreetama

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Nalin Mehta, Ankit

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Asselberghs, Inge

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Journal

na

Metrics

1927 since deposited on 2021-12-06

2last month

Acq. date: 2025-12-11