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Articles
ESD protection methodology for deep-submicron CMOS
Publication:
ESD protection methodology for deep-submicron CMOS
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Date
1998
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2560.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bock, Karlheinz
;
Groeseneken, Guido
;
Maes, Herman
Journal
Microelectronics Reliability
Abstract
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1984
since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations
Metrics
Views
1984
since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations