Publication:
Selective area growth of InP in shallow trench isolation (STI) on large scale Si(001) wafer using defect confinement technique
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1882 since deposited on 2021-10-21
1last month
Acq. date: 2026-03-16
Citations
Statistics
Views
1882 since deposited on 2021-10-21
1last month
Acq. date: 2026-03-16
Citations