Non-Gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown

dc.contributor.author	Vandewalle, N.
dc.contributor.author	Ausloos, M.
dc.contributor.author	Houssa, Michel
dc.contributor.author	Mertens, Paul
dc.contributor.author	Heyns, Marc
dc.contributor.imecauthor	Houssa, Michel
dc.contributor.imecauthor	Mertens, Paul
dc.contributor.imecauthor	Heyns, Marc
dc.contributor.orcidimec	Houssa, Michel::0000-0003-1844-3515
dc.date.accessioned	2021-10-14T11:51:35Z
dc.date.available	2021-10-14T11:51:35Z
dc.date.issued	1999
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/3970
dc.source.beginpage	1579
dc.source.endpage	1581
dc.source.issue	11
dc.source.journal	Appl. Phys. Lett.
dc.source.volume	74
dc.title	Non-Gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown
dc.type	Journal article
dspace.entity.type	Publication
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