Publication:

High-energy neutrons effect on strained and non-strained SO MuGFETs and planar MOSFETs

Date

2012
Journal article
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dc.contributor.authorKilchytska, V.
dc.contributor.authorAlvarado, J.
dc.contributor.authorPut, Sofie
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMilitaru, O.
dc.contributor.authorBerger, G.
dc.contributor.authorFlandre, D.
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-20T12:14:42Z
dc.date.available2021-10-20T12:14:42Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20932
dc.source.beginpage118
dc.source.endpage123
dc.source.issue1
dc.source.journalMicroelectronics Reliability
dc.source.volume52
dc.title

High-energy neutrons effect on strained and non-strained SO MuGFETs and planar MOSFETs

dc.typeJournal article
dspace.entity.typePublication
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